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About Scienta Omicron
Welcome Statement
Our Company
Conferences
Careers
Press Information
Contact us
Brochures
Pico-Newsletter
Posters & Rollups
Links
Scanning Probe Microscopy
TESLA JT SPM
Fermi DryCool SPM
Fermi SPM
LT STM
VT SPM
LT NANOPROBE
Large Sample SPM
SPM Controller
MATRIX SPM Control
ZyVector
SPIP-Analytical Software
SPM-Accessories
UHV Tip Preparation Tool
W-Tek Tip Etching Tool
Electron Spectroscopy
XPS Systems
ESCA 2SR
HAXPES-Lab
Custom XPS
ARPES Systems
ARPES-Lab
APPES Systems
HiPP-Lab
Ultimate iXPS & µARUPS
NanoESCA
Auger Systems
NanoSAM Lab
Electron Spectrometers
General Information
DA30-L
HIPP-2
HIPP-3
EW4000
R3000
ARTOF-2
Argus CU
PEEM
FOCUS PEEM
X-Ray & Photon Sources
XM 1000
Dual Anode X-Ray Source
HIS 13
HIS 14 HD
VUV5k
Electron Sources
SEM 250 / SEM 500
LEED & RHEED
RHEED
LEED
Ion Sources
FDG 150
FDG 15
GCIB 10S
Software & Electronics
MATRIX
LEED Software
Molecular Beam Epitaxy
MBE Systems
Lab10 MBE System
EVO-25/50 MBE Systems
PRO-75/100 MBE Systems
Custom MBE Systems
Cluster Systems
E-Beam Evaporators
General Information
EFM 2
EFM 3
EFM 3i
EFM 4
EFM 6
Triple EFM
EFM-H
EBVV63
EBV40/100
EBVM
Effusion Cells
NTEZ
WEZ
HTEZ/HTS
PEZ
OREZ
OME
SUSI
SUKO
DECO
Cracker & Valved Sources
Hydrogen Cracker Source (HABS)
Plasma Source (Nitrogen / Oxygen)
Valved Arsenic Cracker Source
Valved GaP Compound Source
Valved Alkali Metal Source
Valved Corrosive Cracker Source for Sb, Te, Mg
Tailored Systems
MULTIPROBE Systems
General Information
Compact SPM Systems
MULTIPROBE Compact
MULTIPROBE S
MULTIPROBE P, XP, XA, RM
MULTIPROBE MXPS
MULTIPROBE ARPES
Cluster Systems
FZ Juelich Cluster
IQC Cluster Tool
EIT+ Cluster Tool
UTD Cluster Tool
IFW Dresden Cluster
Materials Innovation Platform
Multi-Technique Systems
General Information
UPS/ARPES Systems
General Information
R4000 & LT-STM (CN)
R3000 & LT-SPM (GB)
R3000 XPS module (CH)
R3000 & VT-XA-STM (RU)
ARXPS with EW4000 (CH)
R4000 ARPES module (GB)
Spectroscopy Systems
Custom MBE Systems
PLC Control System
Mistral UHV System Control
SO-Direct
Electron Diffraction
X-Ray Sources
Ion Sources
Electron Sources
UV-Sources
E-Beam Evaporators
UHV-Suitcase
Spare Parts
Tip-Preparation-Tool
Tip-Etching-Tool
Results
Result of the month
Results
Publications
Customer Service
Help Line
Services
Training
Service Contracts
Software Downloads-MATRIX
MATRIX SPM Control V4.1
Custom Experiments
Custom Scripts
Plug-In Examples-V2.2
Development Kit-V2.2
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Sitemap
1
Home
2
About Scienta Omicron
2.1
Welcome Statement
2.2
Our Company
2.3
Conferences
2.4
Careers
2.5
Press Information
2.6
Contact us
2.7
Brochures
2.8
Pico-Newsletter
2.9
Posters & Rollups
2.10
Links
3
Scanning Probe Microscopy
3.1
TESLA JT SPM
3.2
Fermi DryCool SPM
3.3
Fermi SPM
3.4
LT STM
3.5
VT SPM
3.6
LT NANOPROBE
3.7
Large Sample SPM
3.8
SPM Controller
3.8.1
MATRIX SPM Control
3.8.2
ZyVector
3.8.3
SPIP-Analytical Software
3.9
SPM-Accessories
3.9.1
UHV Tip Preparation Tool
3.9.2
W-Tek Tip Etching Tool
4
Electron Spectroscopy
4.1
XPS Systems
4.1.1
ESCA 2SR
4.1.2
HAXPES-Lab
4.1.3
Custom XPS
4.2
ARPES Systems
4.2.1
ARPES-Lab
4.3
APPES Systems
4.3.1
HiPP-Lab
4.4
Ultimate iXPS & µARUPS
4.4.1
NanoESCA
4.5
Auger Systems
4.5.1
NanoSAM Lab
4.6
Electron Spectrometers
4.6.1
General Information
4.6.2
DA30-L
4.6.3
HIPP-2
4.6.4
HIPP-3
4.6.5
EW4000
4.6.6
R3000
4.6.7
ARTOF-2
4.6.8
Argus CU
4.7
PEEM
4.7.1
FOCUS PEEM
4.8
X-Ray & Photon Sources
4.8.1
XM 1000
4.8.2
Dual Anode X-Ray Source
4.8.3
HIS 13
4.8.4
HIS 14 HD
4.8.5
VUV5k
4.9
Electron Sources
4.9.1
SEM 250 / SEM 500
4.10
LEED & RHEED
4.10.1
RHEED
4.10.2
LEED
4.11
Ion Sources
4.11.1
FDG 150
4.11.2
FDG 15
4.11.3
GCIB 10S
4.12
Software & Electronics
4.12.1
MATRIX
4.12.2
LEED Software
5
Molecular Beam Epitaxy
5.1
MBE Systems
5.1.1
Lab10 MBE System
5.1.2
EVO-25/50 MBE Systems
5.1.3
PRO-75/100 MBE Systems
5.1.4
Custom MBE Systems
5.1.5
Cluster Systems
5.2
E-Beam Evaporators
5.2.1
General Information
5.2.2
EFM 2
5.2.3
EFM 3
5.2.4
EFM 3i
5.2.5
EFM 4
5.2.6
EFM 6
5.2.7
Triple EFM
5.2.8
EFM-H
5.2.9
EBVV63
5.2.10
EBV40/100
5.2.11
EBVM
5.3
Effusion Cells
5.3.1
NTEZ
5.3.2
WEZ
5.3.3
HTEZ/HTS
5.3.4
PEZ
5.3.5
OREZ
5.3.6
OME
5.3.7
SUSI
5.3.8
SUKO
5.3.9
DECO
5.4
Cracker & Valved Sources
5.4.1
Hydrogen Cracker Source (HABS)
5.4.2
Plasma Source (Nitrogen / Oxygen)
5.4.3
Valved Arsenic Cracker Source
5.4.4
Valved GaP Compound Source
5.4.5
Valved Alkali Metal Source
5.4.6
Valved Corrosive Cracker Source for Sb, Te, Mg
6
Tailored Systems
6.1
MULTIPROBE Systems
6.1.1
General Information
6.1.2
Compact SPM Systems
6.1.2.1
SPM Probe
6.1.3
MULTIPROBE Compact
6.1.4
MULTIPROBE S
6.1.5
MULTIPROBE P, XP, XA, RM
6.1.6
MULTIPROBE MXPS
6.1.7
MULTIPROBE ARPES
6.2
Cluster Systems
6.2.1
FZ Juelich Cluster
6.2.2
IQC Cluster Tool
6.2.3
EIT+ Cluster Tool
6.2.4
UTD Cluster Tool
6.2.5
IFW Dresden Cluster
6.2.6
Materials Innovation Platform
6.3
Multi-Technique Systems
6.3.1
General Information
6.4
UPS/ARPES Systems
6.4.1
General Information
6.4.2
R4000 & LT-STM (CN)
6.4.3
R3000 & LT-SPM (GB)
6.4.4
R3000 XPS module (CH)
6.4.5
R3000 & VT-XA-STM (RU)
6.4.6
ARXPS with EW4000 (CH)
6.4.7
R4000 ARPES module (GB)
6.5
Spectroscopy Systems
6.6
Custom MBE Systems
6.7
PLC Control System
6.7.1
Mistral UHV System Control
7
SO-Direct
7.1
Electron Diffraction
7.2
X-Ray Sources
7.3
Ion Sources
7.4
Electron Sources
7.5
UV-Sources
7.6
E-Beam Evaporators
7.7
UHV-Suitcase
7.8
Spare Parts
7.9
Tip-Preparation-Tool
7.10
Tip-Etching-Tool
8
Results
8.1
Result of the month
8.2
Results
8.3
Publications
9
Customer Service
9.1
Help Line
9.2
Services
9.3
Training
9.4
Service Contracts
9.5
Software Downloads-MATRIX
9.5.1
MATRIX SPM Control V4.1
9.5.2
Custom Experiments
9.5.3
Custom Scripts
9.5.4
Plug-In Examples-V2.2
9.5.5
Development Kit-V2.2
10
Contact
11
YouTube channel
12
Impressum
13
Terms and Conditions
14
Privacy policy
15
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