VT SPM

Benchmarking UHV STM and AFM Technology

0009
Author: K. Thürmer and N. C. Bartelt
Publication: PHYSICAL REVIEW B 77, 195425 (2008), Physical Review Letters 100,186101 (2008))
Instrument: VT SPM

Growth of multilayer ice films and the formation of cubic ice imaged with STM at IT = 0.4 pA. Ice films as much as 30 molecular layers thick can be imaged with scanning tunneling microscopy (STM) when negative sample biases -6 ±1 V and sub-picoamp tunneling currents are used.

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