VT SPM

Benchmarking UHV STM and AFM Technology

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Result date: 2006
Author: G. Urbanik et al.
Publication: Eur. Phys. J. B 69, 483–489 (2009)

Conductivity of different terminations in YBa2Cu3O6.6. at 25 K. Scan range 500 nm × 350 nm.

 

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