Modular hardware and software concept

At a glance

  • User friendly & simple QPlus® operation - for all user levels
  • Fast operating QPlus® AFM at low- and room-temperatures
  • Stable distance control Survey scans on surfaces with high corrugation
  • Studying large scale ordering effects Ultimate resolution on molecules

Simplifying QPlus AFM

The new QSpeedTM AFM mode paves the way for stable and high speed QPlus®(1) imaging with large scan ranges and high corrugations. QSpeedTM is based on the Tuned Oscillator AFM technique which has recently been advanced by Udo Schwarz's group at Yale University through which it is licensed (2).

The method overcomes limitations of conventional frequency modulated QPlus® AFM with slow scan speeds, where single survey images on the scale of 100 nanometers can take many hours. In addition, the high probability of tip crashes on largely corrugated, contaminated or charged samples is dramatically reduced and therefore allows using QPlus® AFM technology in a much broader field of applications and with maximum simplicity for less experienced users. 

The first results using QSpeedTM with MATRIX 4 show undisturbed images at surprisingly high scan speed of up to 5µm per second in a VT AFM operated at room temperature in Scienta Omicron´s R&D lab. Although the Si(111) surface was contaminated with weakly bound clusters of several nanometres size, scans were completed with no major tip modification or tip crash. The QSpeedTM AFM mode will be available for all MATRIX 4 controllers using Scienta Omicron's new Zurich Instruments powered PLL AFM controller.

(1) F.-J. Giessibl, Science, 1995, 267(5194): 68-71

(2) Tuned-Oscillator Atomic Force Microscopy, licenced from Yale University, O.E. Dagdeviren et al., Nanotechnology 27 (2016) 065703, patent pending.


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2018 QSpeed - Simplifying QPlus AFM
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