Materials Innovation Platform (MIP) concept

Accelerating the development of novel materials

At a Glance

Novel materials with unique properties are key enablers for new, disruptive technologies. Of special interest are nanomaterials, which can be engineered for specific physical, electrical, and chemical properties by exploitation of quantum size effects. Understanding cause-effect correlations of these materials' growth and structure supports the systematic discovery and optimization of the desired properties. A proven and effective approach for this research is to use a 'Materials Innovation Platform'.

Materials Innovation Platforms (MIPs) integrate instrumentation for growth and detailed characterization of samples in-situ. Not only is sample cleanliness preserved by maintaining UHV conditions, but analysis and growth can be done at intermediate process steps and performed far more rapidly than if the instrumentation was separated.

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Enabling Forefront Research

Modern application fields need both, a fundamental understanding of the underlying physics and chemistry, as well as an integrated approach towards device implementation. A Materials Innovation Platform is the key to success whenever one of these topics is required:

  • Multiple deposition modules and/or different deposition technologies
  • Ultra-clean UHV environment during transfer between modules at any time
  • Surface analysis between process steps for the chemical, electronical and structural investigation of surfaces and interfaces
  • Extendability for additional deposition or analysis techniques
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MIP Core Competencies

Our core competencies enable your success in challenging multi-module projects.


Competence

  • Tailoring solutions to the scientific needs with more than 1000 UHV systems delivered
  • Single source supplier and full project responsibility
  • Global sales & service organisation

Application Know-How

  • Technology leader in UHV surface analysis & MBE
  • More than 30 supported technologies
  • Experience in identifying suitable analysis techniques

Modular, Configurable & Extendable

  • Installed base: >20 complex MIPs, rapidly growing
  • Quality & reliability ensures highest up-time
  • Configurable modules for easy integration

Technical building blocks

  • High quality UHV solutions
  • Linear transfer (LTL)
  • Radial distribution (RDC)
  • Mistral system control
  • Special purpose modules
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Surface Analysis Techniques

Scienta Omicron offers the broadest range of UHV surface chemical & structural analysis techniques, fully integrated and interfaced by a single supplier. Virtually any of our turn-key analysis systems is suitable for use within a Materials Innovation Platform. Third Party systems such as Atomic Layer Deposition (ALD), Focused Ion Beam Lithography (FIB) and many more can be interfaced using dedicated buffer and sample handling systems.

  • Angle Resolved Photoemission Spectroscopy (ARPES-Lab)
  • X-Ray Photoemission Spectroscopy (XPS-Lab)
  • Hard X-Ray Photoemission Spectroscopy (HAXPES-Lab)
  • Momentum Microscopy (NanoESCA)
  • Scanning Auger Microscopy (SAM)
  • Scanning Electron Microscopy (UHV-SEM)
  • Scanning Probe Microscopy (SPM), at variable and low temperatures, and in high magnetic fields
  • Atomically precise electrical probing (LT NANOPROBE)

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Thin Film Deposition Techniques

Proven Research MBE systems - easy to use, flexible, expandable, and covering the full range of MBE-based technologies for small sample plates up to 4" wafers.

  • Si/Ge, III-V, II-VI
  • Oxide, Nitride
  • Organic MBE
  • Transition metal dichalcogenides (TMDs)
  • Topological insulators
  • Laser MBE

Interface technologies for Atomic Layer Deposition (ALD), Pulsed Laser Deposition (PLD), Sputtering and more...

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