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Scanning Probe Microscopy
Electron Spectroscopy
- XPS Systems
- ARPES Systems
  - ARPES-Lab
- APPES Systems
  - HiPP-Lab
- Ultimate iXPS & µARUPS
  - NanoESCA
- Auger Systems
  - NanoSAM Lab
- Electron Spectrometers
  - General Information
  - DA30-L
  - DA20
  - HIPP-2
  - HIPP-3
  - EW4000
  - R3000
  - ARTOF-2
  - Argus CU
  - 3D Spin/VLEED
- PEEM
  - FOCUS PEEM
- X-Ray & Photon Sources
- Electron Sources
  - MCES150
  - SEM 250 / SEM 500
- LEED & RHEED
  - RHEED
  - LEED
- Ion Sources
  - FDG 150
  - FDG 15
  - GCIB 10S
- Software & Electronics
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  - LEED Software
Molecular Beam Epitaxy
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XPS Systems
ARPES Systems
APPES Systems
Ultimate iXPS & µARUPS
Auger Systems
Electron Spectrometers
PEEM
X-Ray & Photon Sources
Electron Sources
- MCES150
- SEM 250 / SEM 500
LEED & RHEED
Ion Sources
Software & Electronics

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> Electron Spectroscopy
> Electron Sources

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Electron Sources

MCES150 electron source

MCES150

Measuring Phonon Dispersion

more info

SEM 250 / SEM 500

Electron source for SEM and Auger experiments with spot size better than 250 nm.

more info

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