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Scanning Probe Microscopy
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MATRIX SPM Control
ZyVector
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W-Tek Tip Etching Tool
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ESCA 2SR
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Custom XPS
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ARPES-Lab
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HiPP-Lab
Ultimate iXPS & µARUPS
NanoESCA
Auger Systems
NanoSAM Lab
Electron Spectrometers
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DA30-L
HIPP-2
HIPP-3
EW4000
R3000
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Argus CU
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PEEM
FOCUS PEEM
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XM 1000
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HIS 13
HIS 14 HD
VUV5k
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SEM 250 / SEM 500
LEED & RHEED
RHEED
LEED
Ion Sources
FDG 150
FDG 15
GCIB 10S
Software & Electronics
MATRIX
LEED Software
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Lab10 MBE System
EVO-25/50 MBE Systems
PRO-75/100 MBE Systems
Custom MBE Systems
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EFM 2
EFM 3
EFM 3i
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EFM-H
EBVV63
EBV40/100
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OME
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Hydrogen Cracker Source (HABS)
Plasma Source (Nitrogen / Oxygen)
Valved Arsenic Cracker Source
Valved GaP Compound Source
Valved Alkali Metal Source
Valved Corrosive Cracker Source for Sb, Te, Mg
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Compact SPM Systems
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MULTIPROBE S
MULTIPROBE P, XP, XA, RM
MULTIPROBE MXPS
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FZ Juelich Cluster
IQC Cluster Tool
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IFW Dresden Cluster
Materials Innovation Platform
Multi-Technique Systems
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UPS/ARPES Systems
General Information
R4000 & LT-STM (CN)
R3000 & LT-SPM (GB)
R3000 XPS module (CH)
R3000 & VT-XA-STM (RU)
ARXPS with EW4000 (CH)
R4000 ARPES module (GB)
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XPS Systems
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APPES Systems
Ultimate iXPS & µARUPS
Auger Systems
Electron Spectrometers
PEEM
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Electron Sources
SEM 250 / SEM 500
LEED & RHEED
Ion Sources
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Electron Spectroscopy
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Electron Sources
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Electron Sources
SEM 250 / SEM 500
Electron source for SEM and Auger experiments with spot size better than 250 nm.
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