ScientaOmicron GmbH - Products
Home
|
About Scienta Omicron
|
Contact
|
YouTube
|
LinkedIn
Scienta Omicron
Germany
China
Japan
South Korea
United States
Canada
Australia
Brazil
India
Italy
Poland
Romania
Russia
Singapore
Spain
Sweden
Taiwan
Turkey
Saudi Arabia
Show help
extended search
About Scienta Omicron
Welcome Statement
Our Company
Conferences
Careers
Press Information
Contact us
Brochures
Pico-Newsletter
Posters & Rollups
Scanning Probe Microscopy
TESLA JT SPM
Fermi DryCool SPM
Fermi SPM
LT STM
VT SPM
LT NANOPROBE
Large Sample SPM
SPM Controller
MATRIX SPM Control
ZyVector
SPIP-Analytical Software
SPM-Accessories
UHV Tip Preparation Tool
W-Tek Tip Etching Tool
Electron Spectroscopy
XPS Systems
XPS-Lab
HAXPES-Lab
Custom XPS
ARPES Systems
ARPES-Lab
APPES Systems
HiPP-Lab
Ultimate iXPS & µARUPS
NanoESCA
Auger Systems
NanoSAM Lab
Electron Spectrometers
General Information
DA30-L
DA20
HIPP-2
HIPP-3
EW4000
R3000
ARTOF-2
Argus CU
3D Spin/VLEED
PEEM
FOCUS PEEM
X-Ray & Photon Sources
XM 1000
Dual Anode X-Ray Source
HIS 13
HIS 14 HD
VUV5k
Electron Sources
SEM 250 / SEM 500
LEED & RHEED
RHEED
LEED
Ion Sources
FDG 150
FDG 15
GCIB 10S
Software & Electronics
MATRIX
LEED Software
Molecular Beam Epitaxy
MBE Systems
Lab10 MBE System
EVO-25/50 MBE Systems
PRO-75/100 MBE Systems
Custom MBE Systems
Materials Innovation Platform
E-Beam Evaporators
General Information
EFM 2
EFM 3
EFM 3i
EFM 4
EFM 6
Triple EFM
EFM-H
EBVV63
EBV40/100
EBVM
Effusion Cells
NTEZ
WEZ
HTEZ/HTS
PEZ
OREZ
OME
SUSI
SUKO
DECO
Cracker & Valved Sources
Hydrogen Cracker Source (HABS)
Plasma Source (Nitrogen / Oxygen)
Valved Arsenic Cracker Source
Valved GaP Compound Source
Valved Alkali Metal Source
Valved Corrosive Cracker Source for Sb, Te, Mg
Tailored Systems
Materials Innovation Platform
Materials Innovation Platform (MIP) concept
Reference Systems
Technical Backbones
MULTIPROBE Systems
General Information
Compact SPM Systems
MULTIPROBE Compact
MULTIPROBE S
MULTIPROBE P, XP, XA, RM
MULTIPROBE MXPS
MULTIPROBE ARPES
Custom MBE Systems
UPS/ARPES Systems
General Information
R4000 & LT-STM (CN)
R3000 & LT-SPM (GB)
R3000 XPS module (CH)
R3000 & VT-XA-STM (RU)
ARXPS with EW4000 (CH)
R4000 ARPES module (GB)
Spectroscopy Systems
SO-Direct
Electron Diffraction
X-Ray Sources
Ion Sources
Electron Sources
UV-Sources
E-Beam Evaporators
UHV-Suitcase
Spare Parts
Tip-Preparation-Tool
Tip-Etching-Tool
Results
Result of the month
Results
Publications
Customer Service
Customer Support
Services
Training
Service Contracts
Upgrades
SPM Upgrades
ESPEC Upgrades
Systems Upgrades
Spare Parts
Software Downloads-MATRIX
MATRIX SPM Control V4.1
Custom Experiments
Custom Scripts
Plug-In Examples-V2.2
Development Kit-V2.2
XPS Systems
ARPES Systems
APPES Systems
Ultimate iXPS & µARUPS
Auger Systems
Electron Spectrometers
PEEM
X-Ray & Photon Sources
Electron Sources
SEM 250 / SEM 500
LEED & RHEED
Ion Sources
Software & Electronics
Navigation
>
Electron Spectroscopy
>
Electron Sources
Print view
Electron Sources
SEM 250 / SEM 500
Electron source for SEM and Auger experiments with spot size better than 250 nm.
more info
Top
Feedback
