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Scanning Probe Microscopy
TESLA JT SPM
Fermi DryCool SPM
Fermi SPM
LT STM
VT SPM
LT NANOPROBE
Large Sample SPM
SPM Controller
MATRIX SPM Control
ZyVector
SPIP-Analytical Software
SPM-Accessories
UHV Tip Preparation Tool
W-Tek Tip Etching Tool
Electron Spectroscopy
XPS Systems
ESCA 2SR
HAXPES-Lab
Custom XPS
ARPES Systems
ARPES-Lab
APPES Systems
HiPP-Lab
Ultimate iXPS & µARUPS
NanoESCA
Auger Systems
NanoSAM Lab
Electron Spectrometers
General Information
DA30-L
HIPP-2
HIPP-3
EW4000
R3000
ARTOF-2
Argus CU
PEEM
FOCUS PEEM
X-Ray & Photon Sources
XM 1000
Dual Anode X-Ray Source
HIS 13
HIS 14 HD
VUV5k
Electron Sources
SEM 250 / SEM 500
LEED & RHEED
RHEED
LEED
Ion Sources
FDG 150
FDG 15
GCIB 10S
Software & Electronics
MATRIX
LEED Software
Molecular Beam Epitaxy
MBE Systems
Lab10 MBE System
EVO-25/50 MBE Systems
PRO-75/100 MBE Systems
Custom MBE Systems
Cluster Systems
E-Beam Evaporators
General Information
EFM 2
EFM 3
EFM 3i
EFM 4
EFM 6
Triple EFM
EFM-H
EBVV63
EBV40/100
EBVM
Effusion Cells
NTEZ
WEZ
HTEZ/HTS
PEZ
OREZ
OME
SUSI
SUKO
DECO
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Hydrogen Cracker Source (HABS)
Plasma Source (Nitrogen / Oxygen)
Valved Arsenic Cracker Source
Valved GaP Compound Source
Valved Alkali Metal Source
Valved Corrosive Cracker Source for Sb, Te, Mg
Tailored Systems
MULTIPROBE Systems
General Information
Compact SPM Systems
MULTIPROBE Compact
MULTIPROBE S
MULTIPROBE P, XP, XA, RM
MULTIPROBE MXPS
MULTIPROBE ARPES
Cluster Systems
FZ Juelich Cluster
IQC Cluster Tool
EIT+ Cluster Tool
UTD Cluster Tool
IFW Dresden Cluster
Materials Innovation Platform
Multi-Technique Systems
General Information
UPS/ARPES Systems
General Information
R4000 & LT-STM (CN)
R3000 & LT-SPM (GB)
R3000 XPS module (CH)
R3000 & VT-XA-STM (RU)
ARXPS with EW4000 (CH)
R4000 ARPES module (GB)
Spectroscopy Systems
Custom MBE Systems
PLC Control System
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SO-Direct
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XPS Systems
ARPES Systems
APPES Systems
Ultimate iXPS & µARUPS
Auger Systems
Electron Spectrometers
PEEM
X-Ray & Photon Sources
Electron Sources
SEM 250 / SEM 500
LEED & RHEED
Ion Sources
Software & Electronics
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Electron Spectroscopy
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Electron Sources
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Electron Sources
SEM 250 / SEM 500
Electron source for SEM and Auger experiments with spot size better than 250 nm.
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