ScientaOmicron GmbH - Magnetic Probes
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Scanning Probe Microscopy
TESLA JT SPM
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MATRIX SPM Control
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DA30-L
DA20
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HIPP-3
EW4000
R3000
ARTOF-2
Argus CU
3D Spin/VLEED
PEEM
FOCUS PEEM
X-Ray & Photon Sources
XM 1000
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HIS 13
HIS 14 HD
VUV5k
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SEM 250 / SEM 500
LEED & RHEED
RHEED
LEED
Ion Sources
FDG 150
FDG 15
GCIB 10S
Software & Electronics
MATRIX
LEED Software
Molecular Beam Epitaxy
MBE Systems
Lab10 MBE System
EVO-25/50 MBE Systems
PRO-75/100 MBE Systems
Custom MBE Systems
Cluster Systems
E-Beam Evaporators
General Information
EFM 2
EFM 3
EFM 3i
EFM 4
EFM 6
Triple EFM
EFM-H
EBVV63
EBV40/100
EBVM
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NTEZ
WEZ
HTEZ/HTS
PEZ
OREZ
OME
SUSI
SUKO
DECO
Cracker & Valved Sources
Hydrogen Cracker Source (HABS)
Plasma Source (Nitrogen / Oxygen)
Valved Arsenic Cracker Source
Valved GaP Compound Source
Valved Alkali Metal Source
Valved Corrosive Cracker Source for Sb, Te, Mg
Tailored Systems
Materials Innovation Platform
Materials Innovation Platform (MIP) concept
Reference Systems
Technical Backbones
MULTIPROBE Systems
General Information
Compact SPM Systems
MULTIPROBE Compact
MULTIPROBE S
MULTIPROBE P, XP, XA, RM
MULTIPROBE MXPS
MULTIPROBE ARPES
Custom MBE Systems
UPS/ARPES Systems
General Information
R4000 & LT-STM (CN)
R3000 & LT-SPM (GB)
R3000 XPS module (CH)
R3000 & VT-XA-STM (RU)
ARXPS with EW4000 (CH)
R4000 ARPES module (GB)
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SO-Direct
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Magnetic Probes
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