The AFM Technology of the Variable Temperature SPM is based on more than 20 years of experience in Atomic Force Microscopy in UHV. It has been continuously developed and improved. The classic Beam Deflection AFM for contact and non-contact AFM offers the flexibility for many operational modes and different cantilever types. For example high resolution AFM, Friction Force Microscopy, Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (SKPM) and Magnetic Force Microscopy (MFM) are available.
The latest major development is a new AFM preamplifier which increases the detection bandwidth from 450 kHz to 2 MHz. In combination with the new AFM electronics (PLL) of the MATRIX Control System, users can now use high resonant frequency cantilevers for high speed non-contact AFM measurements.
This new preamplifier technology in combination with an improved light source is also available as an upgrade package for existing Variable Temperature AFM’s. Please contact your local sales representative or our service support team (email@example.com) if you are interested in upgrading your system.
The new “QPlus” sensor, based on a tuning fork design, is today extending the possible application range of the Variable Temperature SPM.
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