The Scienta Omicron LT STM and the TESLA JT STM systems are dedicated to surface science at cryogenic temperatures at 5 K or below.
The Scienta Omicron VT SPM and the Fermi SPM are dedicated to surface science at temperatures between 25 K and 1500 K (VT SPM) or 10 K to 400 K (Fermi SPM).
The Large Sample UHV SPM for STM and AFM is designed for samples and wafers up to 4” diameter. Internal eddy current damping, customized sample stages and system integration combines SPM technology with wafer production and analysis.
Both, the LT NANOPROBE and the UHV NANOPROBE with its four independent SPM probe stations are analytical instruments specifically designed for local and non-destructive 4-point contact measurements on all kind of nanostructures.
The SPM Probe is a compact and costeffective complete UHV system solution for Scienta Omicron’s UHV SPMs. The rigid bench construction is ideally suited for high resolution SPM work.
Precise and accurate equipment: the MS5 Micro Piezo Slide (photo), the W-TEK semi-automatic tip etching device and the UHV Tip preparation Tool for e-beam tip cleaning.
The MATRIX SPM Control System combines a modular hardware and software concept to operate scanning probe microscopes.
It is a fully digital control system integrated with the latest multiprocessor technology.
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