- T < 1.4 K
- B > 3 T
- Hold time at 1.4 K: 120h
- Increased hold time: > 65 h
- High frequency cabling
- Increases STS resolution
- Infinite measurement time and convenient cooling T < 10 K
- Picometer stability for long-term spectroscopy
- Independent tip and sample temperature control (T < 10 to 400 K)
- Tip and sample cold for superior drift performance
- Scienta Omicron leading QPlus technology
- Bolt-On solution
The Variable Temperature UHV SPM (VT SPM) from Omicron sets the benchmark for UHV AFM and STM technology. It offers a heating cooling concept for SPM in a temperature range from 25 K to 1500 K and many other features.
The Low Temperature LT NANOPROBE defines a new class of analytical instrumentation that merges SEM navigated nanoprobing at LHe temperatures with high performance STM imaging, spectroscopy and manipulation.
The Large Sample UHV SPM for STM and AFM is designed for samples and wafers up to 4” diameter. Internal eddy current damping, customized sample stages and system integration combines SPM technology with wafer production and analysis.
The MATRIX SPM Control System combines a modular hardware and software concept to operate scanning probe microscopes.
It is a fully digital control system integrated with the latest multiprocessor technology.
Precise and accurate equipment: the MS5 Micro Piezo Slide (photo), the W-TEK semi-automatic tip etching device and the UHV Tip preparation Tool for e-beam tip cleaning.
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