MULTIPROBE P, XP, XA, RM

Standard System Solutions for Multi-Technique Applications

At a Glance

The dedicated standard sample preparation variants P, XP and RM are tailored to fit the MULTIPROBE S system easily, even for a later upgrade. The MULTIPROBE LT–S system can be upgraded with the XP or XA variant at any time. The powerful XA solution is a combination of an analysis and a preparation chamber.

The MULTIPROBE P is a dual-chamber surface science UHV system with a large multi-technique analysis chamber for electron spectroscopy and UHV scanning probe microscopy, and a separate sample preparation chamber with FEL. The preparation chambers in the MULTIPROBE P offers standard sample preparation facilities like thin film growth or sample sputtering and heating.

The MULTIPROBE XP is a dual-chamber surface science UHV system with a large multi-technique analysis chamber for electron spectroscopy and UHV scanning probe microscopy, and a separate sample preparation chamber with FEL. The preparation chamber in the MULTIPROBE XP offers extended sample preparation including sample sputtering, heating and thin film growth with in-situ characterisation by LEED or RHEED in the MULTIPROBE XP.

The MULTIPROBE RM is a dual chamber surface science UHV system with a large multi-technique analysis chamber for electron spectroscopy and scanning probe microscopy, and a separate MBE chamber with LN2 cooling shroud ideally suited for research MBE and in-situ thin film growth characterisation with RHEED.

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