FOCUS PEEM

At a Glance

  • Surface Sensitive Microscopy
  • 20 nm Lateral Resolution
  • Local Spectroscopy
  • k-Space imaging
  • Easy to Operate
  • Compatible with MULTIPROBE UHV Systems
  • A FOCUS product
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A Powerful Tool for Surface Analysis

Photoemission Electron Microscopy (PEEM) is an extremely powerful imaging technique, whose versatility for topographical, chemical and magnetic contrast imaging at high resolution has been demonstrated in many laboratory and synchrotron applications.

Important contributions to the characterization of magnetic devices, Plasmon research, surface chemistry and high lateral resolution chemical analysis in combination with synchrotron radiation, investigation of time resolved processes and k-space imaging are only a few examples of active PEEM based research. In contrast to a Scanning Electron Microscope (SEM), PEEM directly images surface areas emitting photoelectrons in real-time, without scanning.

Electron emission from surfaces can be caused in various ways - by photon irradiation excitation, thermally, via electron/ion bombardment or by field emission. Over the years the FOCUS-PEEM has been continually improved in performance and usability. The PEEM together with the dedicated high stability integrated sample stage (IS) and various available energy filters follow a modular concept easy to upgrade. In addition software assisted operation ensures time efficient and secure PEEM operation even on challenging samples. With more than 50 units in the market the FOCUS IS-PEEM is a powerful surface analysis tool.

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