ESCA 2SR is a versatile XPS instrument allowing for surface characterization by routine and advanced XPS and ESCA applications.
It is a convenient to use turnkey system which combines high sensitivity, excellent energy resolution and high sample throughput with an advanced sample stage concept optimized for routine and advanced scientific experiments. The stage handles multiple thin and thick samples and can be easily customized for individual needs of a specific experiment including options for heating and cooling.
The ESCA 2SR system includes a state of the art 128 channels detector, a dedicated 500 mm Rowland circle high power monochromatic x-ray source and efficient charge neutralization. A monoatomic ion sputter source is included in the base configuration.
The configuration of the ESCA 2SR can be easily expanded for a cluster ion source, a dual beam x-ray source, a UV source and various preparation facilities.