At a Glance

  • 30° degrees full cone acceptance without sample rotation
  • Spin-resolved MDC without sample rotation
  • Patented (WO2013/133739)
  • Improved ky accuracy (resolution better than 0.1º)
  • Time saving (electronic deflection is faster than rotation)
  • Matrix element effects are avoided by keeping sample fixed
  • Manipulator requirements are reduced
  • Ensures same spot for all k//

With the new DA30-L, we are proud to present the world’s first hemispherical analyser using deflectors that enables angular scans in two dimensions in k-space without tilting the sample.


Spin Scan

A major advantage of the MCP/CCD and spin detection combination is that the parallel angular detection can be used to ensure that the spin-resolved measurement is performed at the desired point in k-space. In the previous analysers, this has been acheived by first recording a parallel ARPES spectrum with the MCP/CCD detector and then, without tilting the sample, recording a spin-resolved spectrum for the center of that spectrum.

With the new analyser concept deflectors have been added. This can be used to record spin-resolved spectra for all points of the recorded ARPES spectrum. Different lines can of course be combined to cover the whole plane in θx-E-space.