MULTIPROBE MXPS RM of Dr. Olivier Renault’s group at CEA-LETI Institute, MINATEC Nanocharacterization Centre in France. This dedicated XPS System is equipped with customized analysis and preparation chambers and a loadlock for fast sample introduction. It is designed to work either in a laboratory setting or at a synchrotron beam line. The analysis chamber is equipped with state-of-the-art analysis equipment to perform angle resolved XPS analysis. It includes a 5-axis liquid helium cooled high performance manipulator, a High Resolution Electron Analyser (EA125 U7 HR), a monochromated X-Ray source (XM 1000) as well as a dual-anode X-Ray source (DAR 400), source for charge neutralization (CN 10), depth profiling (FIG 05) & UPS (HIS 13), and a 4-grid LEED (SPEC 4).