Argus is a next generation hemispherical analyser with multichannel detection technology developed for uncompromised XPS and ESCA analysis. It is a multi-purpose easy-to-use electron spectrometer with excellent transmission and outstanding sensitivity provided by state-of-the-art multi channel detection. Dedicated detection modes such as Snapshot XPS and chemical state imaging guarantee that relevant information from the sample surface is provided to the scientist fast and easily.
Rapid and reliable quantitative analysis relies on high sensitivity detectors and well characterized high-transmission electron optics in all parts of the spectrometer from the lens entrance to the detector surface. The Argus is based on proven lens design optimized by extensive electron optical simulations and careful verification in experiments.
Well defined small spot analysis is guaranteed by a dedicated and easy-to-use aperture mechanism. The combination of a double aperture mechanism and a fully characterized magnification lens ensures defined area analysis from several mm down to <60um diameter without crosstalk from the surrounding area.
While imaging XPS ensures navigation and identification of inhomogeneous samples the multi channel detector increases analysis speed and provides modes e.g. for dynamic process analysis.